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May 8 – 12, 2023
Norfolk Waterside Marriott
US/Eastern timezone

Using a Neural Network to Approximate the Negative Log Likelihood Distribution

May 9, 2023, 5:15 PM
15m
Hampton Roads VII (Norfolk Waterside Marriott)

Hampton Roads VII

Norfolk Waterside Marriott

235 East Main Street Norfolk, VA 23510
Oral Track 9 - Artificial Intelligence and Machine Learning Track 9 - Artificial Intelligence and Machine Learning

Speaker

Liu, Shenghua (University of Notre Dame)

Description

An increasingly frequent challenge faced in HEP data analysis is to characterize the agreement between a prediction that depends on a dozen or more model parameters–such as predictions coming from an effective field theory (EFT) framework–and the observed data. Traditionally, such characterizations take the form of a negative log likelihood (NLL) distribution, which can only be evaluated numerically. The lack of a closed-form description of the NLL function makes it difficult to convey results of the statistical analysis. Typical results are limited to extracting "best fit" values of the model parameters and 1-D intervals or 2-D contours extracted from scanning the higher dimensional parameter space. It is desirable to explore these high-dimensional model parameter spaces in more sophisticated ways. One option for overcoming this challenge is to use a neural network to approximate the NLL function. This approach has the advantage of being continuous and differentiable by construction, which are essential properties for an NLL function and may also provide useful handles in exploring the NLL as a function of the model parameters. In this talk, we describe the advantages and limitations of this approach in the context of applying it to a CMS data analysis using the framework of EFT.

Consider for long presentation Yes

Primary author

Liu, Shenghua (University of Notre Dame)

Co-authors

Jamieson, Nathan (University of Notre Dame) Prof. Lannon, Kevin (University of Notre Dame) Mohrman, Kelci (University of Notre Dame) Negash, Sirak (University of Notre Dame) Wan, Yuyi (University of Notre Dame)

Presentation materials

Peer reviewing

Paper