Speaker
Description
Amplifier Additive Phase Modulation (APM) noise performance is a critical and often overlooked parameter which may significantly impact the signal integrity of Communication, RADAR, EW, Synthesizer, Frequency Converter, and related equipment.
This tutorial will address APM noise test equipment capabilities and limitations and will provide a detailed description of Mini-Circuits’ Device Under Test (DUT) characterization procedures and methodologies.
A theoretical discussion of white and flicker noise processes in amplifiers and their impact on APM noise performance in both small and larger signal regions of operation will be presented.
The tutorial will further demonstrate that AM-to-PM distortion, another often unspecified amplifier parameter, may significantly degrade APM noise performance in both the White and Flicker noise regions when operating near or above the amplifiers 1 dB compression point.
Active device technologies and different amplifier topologies are discussed and measured data supporting the results are presented.
| Abstract Category | Hardware |
|---|
