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INVESTIGATION OF SIS MULTILAYER FILMS AT HZB

Mar 18, 2021, 10:00 AM
20m
Virtual Edition

Virtual Edition

Bluejeans
RF and material characterization for SRF films RF and material characterization for SRF films

Speaker

Dmitry Tikhonov (Helmholtz Zentrum Berlin)

Description

The systematic study of multilayer SIS films (Superconductor-Insulator-Superconductor) is being conducted in Helmholtz-Zentrum Berlin. Such films theoretically should boost the performance of superconducting cavities, and reduce some problems related to bulk Nb such as magnetic flux trapping. Up to now such films have been presented in theory, but the RF performance of those structures have not been widely studied. In this contribution we present the results of the latest tests of AlN-NbN films, deposited on micrometers-thick Nb layers on copper. It has, also, been shown previously at HZB that such SIS films may show some unexpected behavior in surface resistance versus temperature parameter space. In this contribution we continue to investigate those effects with the variation of different parameters of films (such as insulator thickness) and production recipes.

Primary authors

Dmitry Tikhonov (Helmholtz Zentrum Berlin) Oliver Kugeler (Helmholtz Zentrum Berlin) Sebastian Keckert (Helmholtz-Zentrum Berlin) Jens Knobloch (Helmholtz-Zentrum Berlin and University of Siegen) Eduard Chyhyrynets (LNL - INFN; University of Padua) Stewart Leith Michael Vogel (University of Siegen) Cristian Pira (INFN LNL)

Presentation materials