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Upgrades to the Cornell sample host cavity

Mar 18, 2021, 9:00 AM
20m
Virtual Edition

Virtual Edition

Bluejeans
RF and material characterization for SRF films RF and material characterization for SRF films

Speaker

Thomas Oseroff (Cornell University)

Description

The Cornell sample host cavity was designed to measure the surface resistance of 5” diameter disks at 4 GHz as a function of temperature and RF field strength. Major changes to the system have been completed, including the addition of a transmitted power probe and a complete redesign of the fundamental power coupler. Calibration results demonstrating the improved performance are presented and conclusions about measurement reliability are considered.

Summary

Update on Cornell sample host cavity

Primary author

Thomas Oseroff (Cornell University)

Co-authors

Zeming Sun (CLASSE) Matthias Liepe (Cornell University)

Presentation materials