Speaker
Description
Measuring the surface resistance of samples is key for identifying and optimizing suitable materials and coated structures for SRF cavities with performances beyond the limits of niobium. The Helmholtz-Zentrum Berlin (HZB) routinely operates a Quadrupole Resonator (QPR) for the characterization of SRF samples. Over the past years, the setup has been continuously improved and now allows precision measurements of the surface resistance as a function of temperature, RF field and frequency. However, the effort for a single measurement run is high and limits the number of samples that can be tested in a given time.
Currently, a new sample test cavity is under development. Based on the simple geometry of a cylindrical cavity, tests with reduced resolution and restricted parameter space but with much higher throughput are possible, enabling pre-selection measurements for QPR runs.
Complementary to this, the technique of recording dynamic temperature and magnetic field maps is applied to coated samples to further investigate the issue of trapped flux in thin film systems.
