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Measurement system for lambda of thin-film sample at Kyoto University

Not scheduled
20m
Virtual Edition

Virtual Edition

Bluejeans
RF and material characterization for SRF films RF and material characterization for SRF films

Speaker

Yoshihisa Iwashita (Kyoto University)

Description

Measurement system for lambda of thin-film sample at Kyoto University

Primary authors

Yoshihisa Iwashita (Kyoto University) Takayuki Saeki (KEK)

Presentation materials

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