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Overview of thin-film studies at KEK and Kyoto University.

Mar 18, 2021, 8:00 AM
20m
Virtual Edition

Virtual Edition

Bluejeans
RF and material characterization for SRF films RF and material characterization for SRF films

Speaker

Takayuki Saeki (KEK)

Description

We have a system for the third harmonic measurement of thin-film sample at KEK, and NbN thin-film samples were measured. We have another system for the third harmonic measurement of thin-film sample at Kyoto University and NbN and NbTiN thin-film samples were measured. The NbN thin-film samples were created by ULVAC, Inc. in collaboration with KEK. The NbTiN thin-film sample was created by JLab. These measurement systems are cooled down with liquid helium and various setups can be inserted into the cryostats for measurements of samples, and in particular, we are going to measure 3.0-GHz cavities by the cryostat at KEK to focus on the thin-film experiment. 3.0-GHz caivities were fabricated in collaboration with JLab. This article presents the details of the activities and the measurements of NbN and NbTiN samples by these systems at KEK and Kyoto Univiersity.

Primary authors

Takayuki Saeki (KEK) Hitoshi Hayano (KEK) Dr Hayato Ito (KEK) Dr Ryo Katayama (KEK) Takayuki Kubo (KEK) Shinichiro Michizono (KEK) Kensei Umemori (KEK) Yoshihisa Iwashita (Kyoto University) Mr Hiromu Tongu (Kyoto University) Ms Ayaka Hattori (National Institute of Technology, Ibaraki College) Anne-Marie Valente-Feliciano (Jefferson Lab) Robert Rimmer (JLab) Fay Hannon (JLab) D. R. Beverstick (JLab) Mr Ito Ryouhei (ULVAC, Inc.) Mr Nagata Tomohiro (ULVAC, Inc.)

Presentation materials