Please visit Jefferson Lab Event Policies and Guidance before planning your next event: https://www.jlab.org/conference_planning.

July 22, 2024
US/Eastern timezone

Vetoing Efficiency of Incoherent Diffractive Vector Meson Production at the Second Interaction Region at the Electron-Ion Collider (Remote)

Jul 22, 2024, 10:20 AM
20m

Speaker

Jihee Kim (Brookhaven National Laboratory)

Description

The Electron-Ion Collider (EIC) will be a novel experimental facility to use a golden process called Deep Inelastic Scattering (DIS). It is designed to explore the properties of gluons in nucleons and nuclei in order to understand the building blocks of visible matter in the universe. The EIC community outlined the physics program of the EIC in White Paper, and the demanding detector requirements and potential technologies to deploy at an EIC detector were published in a comprehensive Yellow Report. The general-purpose detector resulting from this effort, ePIC, is designed to perform a broad physics program. At the same time, the wider EIC community is strongly in favor of a second detector at the EIC. Having two general-purpose collider detectors to support the EIC science program, allows us to have cross-checks and control of systematic for potential scientific discoveries. The second detector should feature complementary technologies where possible. It can also focus on specific measurements that are less well addressed in ePIC. The second interaction region provides improved forward detector acceptance at low $p_{T}$ and a secondary beam focus that enables to enhance the exclusive, tagging, and diffractive physics program. Based on a forward acceptance coverage complementary to the first detector, ePIC, in this talk I will present a simulation study in tagging program using a proposed second interaction region layout with incoherent diffractive vector meson production: $e + Pb \rightarrow e' + J/\Psi + X$. Finally, I will evaluate a rejection factor to separate coherent from incoherent diffractive events with an inclusion of the secondary beam focus feature.

Primary author

Jihee Kim (Brookhaven National Laboratory)

Presentation materials