Speaker
Claire Antoine
(CEA)
Description
We propose an alternative model to explain power dissipation leading to the formation of hot spots in the inner walls of niobium porous thin film superconducting rf cavities. The physical mechanism that we explore is related to the constriction of surface electrical current flow at grain interface boundaries. These constrictions create an additional electrical contact resistance which induces localized punctual heat dissipation. The model is compared to experimental results and is able to very well fit the Q-slope data
Primary authors
Aymeric Ramiere
(Shenzhen University, China)
Claire Antoine
(CEA)
Jay Amrit
(Associate professor)
