7th SRF Materials Workshop

Session

Session 5a - Nb Characterization

6

Jul 17, 2012, 11:00 AM

CEBAF Center F113 (Jefferson Lab)

Conveners

Session 5a - Nb Characterization

• Peter Lee (FSU)
• Alexander Romanenko (FNAL)

28. SIMS Characterization of Impurity Elements in Nb: The Effect of Heat Treatments

Prateek Maheshwari (NCSU)

7/17/12, 11:00 AM

37. Near-Field Nonlinear Microwave Microscopy of Bulk Nb Surfaces

Steven Anlage (U Maryland)

7/17/12, 11:15 AM

38. Preliminary TEM results on high field hot/cold spot cutouts

Yulia Trenikhina (IIT/FNAL)

7/17/12, 11:30 AM

39. Signatures of RF hot spots by superconducting tunnel-junction and Raman spectroscopies

John Zasadzinski (IIT)

7/17/12, 11:45 AM

40. Low-field Quench, HAZ Pits and Strain in a Prototype Cavity for the European XFEL

Roy Crooks (Black Labs Inc.)

7/17/12, 12:00 PM

45. CYCLOPS - CavitY CaLibrated Optical Profilometry System

John Bearden (MicroDynamics, Inc)

7/17/12, 12:15 PM

Internal interferometric profilometry